Paramèt teknik
Modèl pwodwi | DS-200 | DS-210 | DS-220 |
Mezire estrikti * | D/8,SCI | ||
Mezi repetibilite** | ΔE*ab≤ 0.03 | ||
Montre presizyon | 0.01 | ||
Mezire ouvèti | Φ6mm | Φ11mm, Φ6mm | Φ11mm, Φ6mm, Φ3mm |
Espas Koulè ak Endis | Refleksyon, CIE-Lab, CIE-LCh, HunterLab, CIE Luv, XYZ, Yxy, RGB, Koulè diferans (ΔE * ab, ΔE * cmc, ΔE * 94, ΔE * 00), WI (ASTM E313-00, ASTM E313-73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI(ASTM D1925,ASTM E313-00, ASTM E313-73), Blackness (mwen, dM), solidité koulè | ||
Kondisyon sous | A,B,C,D50,D55,D65,D75,F1,F2,F3,F4,F5,F6,F7,F8,F9,F10,F11,F12,CWF,U30,U35,DLF,NBF,TL83, TL84,ID50,ID65,LED-B1,LED-B2,LED-B3,LED-B4,LED-B5,LED-BH1,LED-RGB1,LED-V1,LED-V2 | ||
Sous limyè | dirije | dirije + UV | |
Mezi metòd obsèvasyon | Vizyèl | Kamera | |
Kalibrasyon | Kalibrasyon manyèl | Oto kalibrasyon | |
Sipò lojisyèl | Andriod, iOS, Windows, Wechat app | ||
Garanti presizyon | Garanti mezi | Garanti mezi premye klas | |
Obsèvatè | 2°,10° | ||
Entegre dyamèt esfè | 40mm | ||
Estanda | CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7 | ||
Fason nan espèk | Nano-entegre aparèy espèk | ||
Capteur | Silisyòm photodiode etalaj Doub 16-gwoup | ||
Entèval longèdonn | 10nm | ||
Ranje longèdonn | 400-700nm | ||
Reflectance detèminasyon ranje | 0-200% | ||
Rezolisyon refleksyon | 0.01% | ||
Metòd mezi | Mezi sèl, mezi mwayèn (2 a 99 mezi) | ||
Tan mezi | Apeprè. 1 segonn | ||
Entèfas | USB, Bluetooth | ||
Ekran | Ekran Tout koulè ekran, 2.4 | ||
Kapasite batri | 8000 mezi kontinyèl sou yon sèl chaj, 3.7V / 3000mAh | ||
Lavi limyè | 10 ane ak 1 milyon sik | ||
Lang | Senplifye Chinwa, angle | ||
Depo | Enstriman: 10,000 done; APP: mas depo |